Quantifying Matting Agent Displacement in Package Printing Overprint Coatings
Quantifying matting agent displacement requires z-axis Raman depth profiling and strict viscosity recovery control to stop gloss drift and scuff failure.
Ion Beam Milling
Sample Preparation
Precision material ablation techniques use focused streams of charged atoms to create highly polished, deformation-free cross-sections of delicate multi-layer materials. Applying ion beam milling to coated paper, paperboard, plastic films and flexible packaging substrates reveals the true layer structure without the smearing caused by physical cutting tools. This method is particularly effective for preparing samples for high-resolution scanning electron microscopy.
Structural Detailing
The sputtering process involves directing a beam of argon ions at a low angle towards the edge of a sample shielded by a protective mask. This continuous bombardment removes material atom by atom, leaving a perfectly flat surface that cuts through wood fibres, inorganic pigments, synthetic binders and soft plastic coatings alike. Traditional microtoming often compresses the hollow structures of cellulose fibres or drags soft polymer binders across the boundary between different barrier layers.
In contrast, this atomic-scale milling maintains the spatial integrity of every component, enabling precise thickness measurements of sub-micron barrier coatings.
Analytical Advantage
Accurate visual analysis of the resulting polished edges reveals the penetration depth of inks, varnishes and size-press starches into the fibrous network. It allows manufacturers to study the interface between paperboard fibres and synthetic barrier layers to diagnose issues with adhesion or delamination. Utilizing ion beam milling ensures that the physical dimensions and structural anomalies of the sample are evaluated in their natural, undistorted state.