Surface Analysis
Mass spectrometry techniques identify chemical constituents by measuring the time particles take to travel from an ionized surface to a detector. Through tof-sims, researchers obtain precise mapping of molecular species residing in the outermost layers of materials. High energy ion pulses strike the sample to eject secondary ions, while the flight duration reveals the mass to charge ratio of these particles.
This mechanism provides extreme sensitivity for detection of additives, slip agents, or contaminants on film substrates.
Process Validation
Monitoring barrier performance requires detection of trace migrants that move from packaging adhesives into a substrate. Tof-sims verifies the presence of specific organic molecules at a concentration far below the threshold of standard chromatography. Precise depth profiling allows the operator to determine if a barrier coating remains intact or exhibits pinholes that compromise chemical integrity.
Results from these measurements dictate whether a conversion run meets requirements for food contact safety or volatile content limits.
Substrate Sensitivity
Paper grades treated with synthetic coatings often demand rigorous characterization to ensure consistent printing and gluing performance. Variations in surface energy correlate directly with the distribution of sizing agents or binders detected by this modality. High resolution imaging identifies regional inconsistencies in coating thickness that lead to localized picking or adhesion failures during high speed converting.
The data confirms the chemical homogeneity of the surface before it moves into the final assembly phase of production.
