Elemental Identification
Non-destructive testing of paper coatings and fillers utilizes the characteristic radiation emitted by atoms when they are excited by a high energy source. The x-ray fluorescence analysis identifies the presence and concentration of inorganic elements such as calcium, silicon or titanium within the sheet. It provides rapid results without the need for complex chemical digestion.
Spectral Response
Irradiation of the sample causes inner shell electrons to be ejected which creates a vacancy that is filled by an outer shell electron. This transition releases energy in the form of an x-ray photon with a wavelength unique to the specific element. A detector captures these emissions to build a spectrum that represents the composition of the material.
Inorganic Identification
Monitoring the loading level of white pigments allows mills to maintain consistent brightness and opacity. By using x-ray fluorescence analysis, technicians can verify the coat weight of minerals on the surface of the board in real time. Such verification ensures that the substrate meets the technical requirements for ink absorption and surface smoothness.
The speed of the measurement makes it an ideal tool for quality control on the production line where immediate adjustments to the mineral feed may be necessary.